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Conference Presentation (Other) FZJ-2024-04700
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Experimental Characterization and 1D KMC-Based Simulation of the Reliability of 28 nm BEOL Integrated VCM ReRAM

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2024

Materials Research Society Spring Meeting, SeattleSeattle, USA, 22 Apr 2024 - 26 Apr 20242024-04-222024-04-26

Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 5234 - Emerging NC Architectures (POF4-523) (POF4-523)
  2. BMBF 16ME0399 - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0399) (BMBF-16ME0399)
  3. BMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) (BMBF-16ME0398K)
  4. BMBF 03ZU1106AA - NeuroSys: Memristor Crossbar Architekturen (Projekt A) - A (03ZU1106AA) (03ZU1106AA)

Appears in the scientific report 2024
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JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-7
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Publications database
 Record created 2024-07-04, last modified 2025-01-21
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