TY  - CONF
AU  - Kopperberg, N.
AU  - Wiefels, Stefan
AU  - Hofmann, K.
AU  - Otterstedt, J.
AU  - Wouters, D. J.
AU  - Waser, R.
AU  - Menzel, Stephan
TI  - Experimental Characterization and 1D KMC-Based Simulation of the Reliability of 28 nm BEOL Integrated VCM ReRAM
M1  - FZJ-2024-04700
PY  - 2024
T2  - Materials Research Society Spring Meeting
CY  - 22 Apr 2024 - 26 Apr 2024, Seattle (USA)
Y2  - 22 Apr 2024 - 26 Apr 2024
M2  - Seattle, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/1028627
ER  -