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Contribution to a conference proceedings | FZJ-2024-04797 |
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2024
Abstract: In targeting lifetimes of 10 years, accelerated stress testing becomes inevitable forensuring the longevity and successful market introduction of SOCs. These elevatedstressors can impact various degradation mechanisms to differing extents and may pushthe cell into unstable operating regimes, resulting in behaviors irrelevant to nominaloperating conditions. Consequently, designing such tests presents a significant challenge.For SOCs aiming for operating temperatures below 600°C, elevated operatingtemperatures are necessary to accelerate aging due to microstructural changes.Accelerated stress tests are tailored for state-of-the-art screen-printed Ni/GDC cermet fuelelectrodes, utilizing symmetrical cells to mitigate the impact of the air electrode. Thesecells operate at temperatures ranging from 600 to 750°C with a high steam content of50%. Electrode performance over time is monitored using electrochemical impedancespectroscopy. Temporal changes in loss processes are identified through DRT analysis,followed by fitting to an equivalent circuit model. We introduce a quantitative analysismethod and a corresponding aging model for direct comparison between degradationunder different stressors.
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