%0 Journal Article
%A Jo, Seohyeon
%A Kindelmann, Moritz
%A Jennings, Dylan
%A Balice, Luca
%A Sohn, Yoo Jung
%A Scheld, Walter Sebastian
%A Bram, Martin
%A Guillon, Olivier
%A Mayer, Joachim
%A Raj, Rishi
%T Flash‐induced defects in single‐crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy
%J Journal of the American Ceramic Society
%V 107
%N 9
%@ 0002-7820
%C Westerville, Ohio
%I Soc.
%M FZJ-2024-05018
%P 5786 - 5800
%D 2024
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001228764000001
%R 10.1111/jace.19915
%U https://juser.fz-juelich.de/record/1029174