Journal Article

FZJ-2024-05018

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Flash‐induced defects in single‐crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy

Jo, S. ; Kindelmann, M.FZJ* ; Jennings, D.FZJ* ; Balice, L.FZJ* ; Sohn, Y. J.FZJ* ; Scheld, W. S.FZJ* ; Bram, M.FZJ* ; Guillon, O.FZJ* ; Mayer, J.FZJ* ; Raj, R. (Corresponding author)

2024
Soc. Westerville, Ohio

This record in other databases:  

Please use a persistent id in citations: doi:10.1111/jace.19915  doi:10.34734/FZJ-2024-05018

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
2. Werkstoffsynthese und Herstellungsverfahren (IMD-2)

Research Program(s):

1. 1231 - Electrochemistry for Hydrogen (POF4-123) (POF4-123)

Appears in the scientific report 2024

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Database coverage:
; ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Wiley ; Ebsco Academic Search ; Essential Science Indicators ; Nationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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