%0 Journal Article
%A Michieletti, Fabio
%A Chen, Shaochuan
%A Weber, Carsten
%A Ricciardi, Carlo
%A Ohno, Takeo
%A Valov, Ilia
%T Influence of active electrode impurity on memristive characteristics of ECM devices
%J Journal of solid state electrochemistry
%V 28
%N 5
%@ 1432-8488
%C New York
%I Springer
%M FZJ-2024-05475
%P 1735 - 1741
%D 2024
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001154437100003
%R 10.1007/s10008-024-05821-w
%U https://juser.fz-juelich.de/record/1030866