Journal Article

FZJ-2024-05475

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Influence of active electrode impurity on memristive characteristics of ECM devices

Michieletti, F. ; Chen, S. ; Weber, C. ; Ricciardi, C. ; Ohno, T. ; Valov, I. (Corresponding author)FZJ*

2024
Springer New York

This record in other databases:  

Please use a persistent id in citations: doi:10.1007/s10008-024-05821-w  doi:10.34734/FZJ-2024-05475

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

Appears in the scientific report 2024

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Springer ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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