TY  - JOUR
AU  - Michieletti, Fabio
AU  - Chen, Shaochuan
AU  - Weber, Carsten
AU  - Ricciardi, Carlo
AU  - Ohno, Takeo
AU  - Valov, Ilia
TI  - Influence of active electrode impurity on memristive characteristics of ECM devices
JO  - Journal of solid state electrochemistry
VL  - 28
IS  - 5
SN  - 1432-8488
CY  - New York
PB  - Springer
M1  - FZJ-2024-05475
SP  - 1735 - 1741
PY  - 2024
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001154437100003
DO  - DOI:10.1007/s10008-024-05821-w
UR  - https://juser.fz-juelich.de/record/1030866
ER  -