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@ARTICLE{Majewski:1033640,
      author       = {Majewski, M. and Qiu, S. and Ronsin, O. and Lüer, L. and
                      Le Corre, V. M. and DU, Tian and Brabec, C. J. and Egelhaaf,
                      Hans-Joachim and Harting, J.},
      title        = {{S}imulation of perovskite thin layer crystallization with
                      varying evaporation rates},
      journal      = {Materials Horizons},
      volume       = {12},
      number       = {2},
      issn         = {2051-6347},
      address      = {Cambridge},
      publisher    = {RSC Publ.},
      reportid     = {FZJ-2024-06512},
      pages        = {555-564},
      year         = {2025},
      abstract     = {Perovskite solar cells (PSC) are promising potential
                      competitors to established photovoltaic technologies due to
                      their superior efficiency and low-cost solution
                      processability. However, the limited understanding of the
                      crystallization behaviour hinders the technological
                      transition from lab-scale cells to modules. In this work,
                      advanced phase field (PF) simulations of solution-based film
                      formation are used for the first time to obtain mechanistic
                      and morphological information that is experimentally
                      challenging to access. The well-known transition from a film
                      with many pinholes, for a low evaporation rate, to a smooth
                      film, for high evaporation rates, is recovered in simulation
                      and experiment. The simulation results provide us with an
                      unprecedented understanding of the crystallization process.
                      They show that supersaturation and crystallization
                      confinement effects determine the final morphology. The
                      ratio of evaporation to crystallization rates turns out to
                      be the key parameter driving the final morphology.
                      Increasing this ratio is a robust design rule for obtaining
                      high-quality films, which we expect to be valid
                      independently of the material type.},
      cin          = {IET-2},
      ddc          = {540},
      cid          = {I:(DE-Juel1)IET-2-20140314},
      pnm          = {1212 - Materials and Interfaces (POF4-121) / 1214 -
                      Modules, stability, performance and specific applications
                      (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1212 / G:(DE-HGF)POF4-1214},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {39495118},
      UT           = {WOS:001346976500001},
      doi          = {10.1039/D4MH00957F},
      url          = {https://juser.fz-juelich.de/record/1033640},
}