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Contribution to a conference proceedings FZJ-2025-00913
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Experimental Evidence for Local Fading Memory Effects in TaOx ReRAM Cells

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2024
IEEE

2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), St AlbansSt Albans, United Kingdom, 21 Oct 2024 - 23 Oct 20242024-10-212024-10-23 IEEE 5 pp. () [10.1109/MetroXRAINE62247.2024.10795989]

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Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA-FIT (JARA-FIT)
  3. Agrosphäre (IBG-3)
  4. JARA Institut Green IT (PGI-10)
Research Program(s):
  1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
  2. DFG project G:(GEPRIS)441957207 - Hardwarerealisierung von universellen speicherbasierten memristiven zellularen Rechnerstrukturen (441957207) (441957207)

Appears in the scientific report 2024
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Document types > Events > Contributions to a conference proceedings
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-10
Institute Collections > IBG > IBG-3
Institute Collections > PGI > PGI-7
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 Record created 2025-01-21, last modified 2025-02-03
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