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Experimental Evidence for Local Fading Memory Effects in TaOx ReRAM Cells
Schmitt, N. ; Messaris, I. ; Demirkol, A. S. ; Ntinas, V. ; Prousalis, D. ; Tetzlaff, R.FZJ* ; Ascoli, A. ; Corinto, F. ; Gilli, M. ; Zhang, S. ; Menzel, S. ; Rana, V.FZJ* ; Chua, L. O.
2024
IEEE
20242024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), St AlbansSt Albans, United Kingdom, 21 Oct 2024 - 23 Oct 20242024-10-212024-10-23
IEEE 5 pp. (2024) [10.1109/MetroXRAINE62247.2024.10795989]2024
This record in other databases:
Please use a persistent id in citations: doi:10.1109/MetroXRAINE62247.2024.10795989
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
- JARA-FIT (JARA-FIT)
- Agrosphäre (IBG-3)
- JARA Institut Green IT (PGI-10)
Research Program(s):
- 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
- DFG project G:(GEPRIS)441957207 - Hardwarerealisierung von universellen speicherbasierten memristiven zellularen Rechnerstrukturen (441957207) (441957207)
Appears in the scientific report
2024