Home > Publications database > Design Optimization of High Voltage Generation for Memristor Electroforming in 28nm CMOS > print |
001 | 1039470 | ||
005 | 20250414120449.0 | ||
024 | 7 | _ | |a 10.1109/ICECS61496.2024.10848531 |2 doi |
024 | 7 | _ | |a WOS:001445799800001 |2 WOS |
037 | _ | _ | |a FZJ-2025-01764 |
041 | _ | _ | |a English |
100 | 1 | _ | |a Shamookh, M. |0 P:(DE-Juel1)201575 |b 0 |e Corresponding author |u fzj |
111 | 2 | _ | |a 2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS) |c Nancy |d 2024-11-18 - 2024-11-20 |w France |
245 | _ | _ | |a Design Optimization of High Voltage Generation for Memristor Electroforming in 28nm CMOS |
260 | _ | _ | |c 2024 |b IEEE |
300 | _ | _ | |a - |
336 | 7 | _ | |a CONFERENCE_PAPER |2 ORCID |
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520 | _ | _ | |a The process of electroforming (EF) a memristor involves setting the channel resistance via current compliance Icc. This EF phase varies in duration based on the EF voltage VEF, requiring high voltage (HV) as a trade-off with EF time. To achieve CMOS-memristor scalable co-integration, on-chip HV-generation is essential. This study presents an analytical design approach for a proposed three-stage charge pump (CP), focusing on achieving optimal balance among efficiency, output ripple, Icc, and minimal capacitor. The proposed 28 nm three-stage CP requires 1.8 V IO devices for 3.35 V output voltage and achieves 46.5% voltage conversion ratio (VCR). It includes a ripple reduction stage to ensure a ripple below 6mV with high current demands of up to 200μA, without an additional space for over-voltage protection within the CP core. Corners and Monte Carlo simulations are conducted to validate the robustness of the design. By eliminating HV-transistors or multi-phase clocks, the design effectively reduces system costs, enhancing the efficiency and scalability of emerging neuromorphic systems. |
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700 | 1 | _ | |a van Waasen, S. |0 P:(DE-Juel1)142562 |b 6 |u fzj |
773 | _ | _ | |a 10.1109/ICECS61496.2024.10848531 |y 2024 |
856 | 4 | _ | |u https://ieeexplore.ieee.org/abstract/document/10848531 |
856 | 4 | _ | |u https://juser.fz-juelich.de/record/1039470/files/Post%20Print.pdf |y Restricted |
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