Dataset

datapubs-14213703425808734829-7469900085559532651

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Replication Data for: Single in-situ interface characterization composed of niobium and a selectively grown (Bi1-xSbx)2Te3 topological insulator nanoribbon

Janßen, K. ; Rüßmann, P. ; Liberda, S. ; Schleenvoigt, M. ; Hou, X. ; Jalil, A. R. ; Lentz, F. ; Trellenkamp, S. ; Bennemann, B. ; Zimmermann, E. ; Mussler, G. ; Schüffelgen, P. ; Schneider, C.-M. ; Blügel, S. ; Grützmacher, D. ; Plucinski, L. ; Schäpers, T.

2024

This record in other databases:

Please use a persistent id in citations: doi:10.26165/juelich-data/47pxbg

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Contributing Institute(s):

1. Helmholtz - Nanofacility (HNF)
2. Quanten-Theorie der Materialien (IAS-1)
3. Quanten-Theorie der Materialien (PGI-1)
4. Elektronische Eigenschaften (PGI-6)
5. Halbleiter-Nanoelektronik (PGI-9)

Research Program(s):

1. 5211 - Topological Matter (POF4-521) (POF4-521)

Appears in the scientific report 2024

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