%0 Journal Article
%A Vishnumurthy, Pramoda
%A Xu, Bohan
%A Wunderwald, Florian
%A Richter, Claudia
%A Rehm, Oliver
%A Baumgarten, Lutz
%A Müller, Martina
%A Mikolajick, Thomas
%A Kersch, Alfred
%A Schroeder, Uwe
%T Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of Zr x Hf 1– x O 2 -Based Capacitors
%J ACS applied electronic materials
%V 6
%N 8
%@ 2637-6113
%C Washington, DC
%I ACS Publications
%M FZJ-2025-02009
%P 6174–6185
%D 2024
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001293298400001
%R 10.1021/acsaelm.4c01025
%U https://juser.fz-juelich.de/record/1040849