Journal Article

FZJ-2025-02009

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of Zr x Hf 1– x O 2 -Based Capacitors

Vishnumurthy, P. ; Xu, B. ; Wunderwald, F. ; Richter, C. ; Rehm, O. ; Baumgarten, L.FZJ* ; Müller, M.FZJ* ; Mikolajick, T. ; Kersch, A. ; Schroeder, U. (Corresponding author)

2024
ACS Publications Washington, DC

This record in other databases:  

Please use a persistent id in citations: doi:10.1021/acsaelm.4c01025

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Contributing Institute(s):

1. Elektronische Eigenschaften (PGI-6)

Research Program(s):

1. 5211 - Topological Matter (POF4-521) (POF4-521)

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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