TY  - JOUR
AU  - Vishnumurthy, Pramoda
AU  - Xu, Bohan
AU  - Wunderwald, Florian
AU  - Richter, Claudia
AU  - Rehm, Oliver
AU  - Baumgarten, Lutz
AU  - Müller, Martina
AU  - Mikolajick, Thomas
AU  - Kersch, Alfred
AU  - Schroeder, Uwe
TI  - Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of Zr x Hf 1– x O 2 -Based Capacitors
JO  - ACS applied electronic materials
VL  - 6
IS  - 8
SN  - 2637-6113
CY  - Washington, DC
PB  - ACS Publications
M1  - FZJ-2025-02009
SP  - 6174–6185
PY  - 2024
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001293298400001
DO  - DOI:10.1021/acsaelm.4c01025
UR  - https://juser.fz-juelich.de/record/1040849
ER  -