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| Home > Publications database > Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of Zr x Hf 1– x O 2 -Based Capacitors > print |
| Home > Publications database > Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of Zr x Hf 1– x O 2 -Based Capacitors > print |
| 001 | 1040849 | ||
| 005 | 20250414120447.0 | ||
| 024 | 7 | _ | |a 10.1021/acsaelm.4c01025 |2 doi |
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| 037 | _ | _ | |a FZJ-2025-02009 |
| 082 | _ | _ | |a 620 |
| 100 | 1 | _ | |a Vishnumurthy, Pramoda |0 0000-0002-5783-1193 |b 0 |
| 245 | _ | _ | |a Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of Zr x Hf 1– x O 2 -Based Capacitors |
| 260 | _ | _ | |a Washington, DC |c 2024 |b ACS Publications |
| 336 | 7 | _ | |a article |2 DRIVER |
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| 700 | 1 | _ | |a Xu, Bohan |0 0000-0001-7780-3424 |b 1 |
| 700 | 1 | _ | |a Wunderwald, Florian |0 P:(DE-HGF)0 |b 2 |
| 700 | 1 | _ | |a Richter, Claudia |0 P:(DE-HGF)0 |b 3 |
| 700 | 1 | _ | |a Rehm, Oliver |0 P:(DE-HGF)0 |b 4 |
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| 700 | 1 | _ | |a Müller, Martina |0 P:(DE-Juel1)130854 |b 6 |
| 700 | 1 | _ | |a Mikolajick, Thomas |0 0000-0003-3814-0378 |b 7 |
| 700 | 1 | _ | |a Kersch, Alfred |0 0000-0003-4407-555X |b 8 |
| 700 | 1 | _ | |a Schroeder, Uwe |0 0000-0002-6824-2386 |b 9 |e Corresponding author |
| 773 | _ | _ | |a 10.1021/acsaelm.4c01025 |g p. acsaelm.4c01025 |0 PERI:(DE-600)2949097-2 |n 8 |p 6174–6185 |t ACS applied electronic materials |v 6 |y 2024 |x 2637-6113 |
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