TY - JOUR AU - Peng, Zijian AU - Wortmann, Jonas AU - Hong, Jisu AU - Zhou, Shuyu AU - Bornschlegl, Andreas J. AU - Haffner-Schirmer, Julian AU - Corre, Vincent M. Le AU - Heumüller, Thomas AU - Osvet, Andres AU - Rand, Barry P. AU - Lüer, Larry AU - Brabec, Christoph J. TI - Locating Non‐Radiative Recombination Losses and Understanding Their Impact on the Stability of Perovskite Solar Cells During Photo‐Thermal Accelerated Ageing JO - Advanced energy materials VL - 15 IS - 35 SN - 1614-6832 CY - Weinheim PB - Wiley-VCH M1 - FZJ-2025-03322 SP - 2502787 PY - 2025 AB - Commercialization of perovskite solar cells (PSCs) requires further breakthroughs in stability, but the complex degradation mechanisms and the interplay of the underlying stress factors complicate insight-driven improvement of long-term stability. This study establishes a quantitative link between potential degradation—specifically open-circuit voltage (VOC) and quasi-Fermi level splitting (QFLS)—and the photo-thermal stability of PSCs. It is highlighted that an increase in non-radiative recombination losses induces the seemingly negligible decrease in VOC and QFLS, though it causes a significant decrease in fill factor (FF) and/or short circuit current (JSC) instead, leading to an overall performance decline. By combining non-destructive photoluminescence imaging and drift-diffusion simulations, it is revealed that during photo-thermal ageing, unstable low-dimensional passivation fails within tens of hours, generating bulk defects, while unstable hole-transport-layer contacts induce interface defects within hours. Building on these findings, a robust hole-transport-layer polymer interface is employed and enhanced perovskite crystal quality to suppress both interface and bulk defect generation during ageing, achieving a T80 lifetime exceeding 1000 h under accelerated ageing conditions (85 °C and two-sun illumination). LB - PUB:(DE-HGF)16 UR - <Go to ISI:>//WOS:001524906500001 DO - DOI:10.1002/aenm.202502787 UR - https://juser.fz-juelich.de/record/1044673 ER -