TY - JOUR
AU - Peng, Zijian
AU - Wortmann, Jonas
AU - Hong, Jisu
AU - Zhou, Shuyu
AU - Bornschlegl, Andreas J.
AU - Haffner-Schirmer, Julian
AU - Corre, Vincent M. Le
AU - Heumüller, Thomas
AU - Osvet, Andres
AU - Rand, Barry P.
AU - Lüer, Larry
AU - Brabec, Christoph J.
TI - Locating Non‐Radiative Recombination Losses and Understanding Their Impact on the Stability of Perovskite Solar Cells During Photo‐Thermal Accelerated Ageing
JO - Advanced energy materials
VL - 15
IS - 35
SN - 1614-6832
CY - Weinheim
PB - Wiley-VCH
M1 - FZJ-2025-03322
SP - 2502787
PY - 2025
AB - Commercialization of perovskite solar cells (PSCs) requires further breakthroughs in stability, but the complex degradation mechanisms and the interplay of the underlying stress factors complicate insight-driven improvement of long-term stability. This study establishes a quantitative link between potential degradation—specifically open-circuit voltage (VOC) and quasi-Fermi level splitting (QFLS)—and the photo-thermal stability of PSCs. It is highlighted that an increase in non-radiative recombination losses induces the seemingly negligible decrease in VOC and QFLS, though it causes a significant decrease in fill factor (FF) and/or short circuit current (JSC) instead, leading to an overall performance decline. By combining non-destructive photoluminescence imaging and drift-diffusion simulations, it is revealed that during photo-thermal ageing, unstable low-dimensional passivation fails within tens of hours, generating bulk defects, while unstable hole-transport-layer contacts induce interface defects within hours. Building on these findings, a robust hole-transport-layer polymer interface is employed and enhanced perovskite crystal quality to suppress both interface and bulk defect generation during ageing, achieving a T80 lifetime exceeding 1000 h under accelerated ageing conditions (85 °C and two-sun illumination).
LB - PUB:(DE-HGF)16
UR - <Go to ISI:>//WOS:001524906500001
DO - DOI:10.1002/aenm.202502787
UR - https://juser.fz-juelich.de/record/1044673
ER -