%0 Journal Article
%A Schnieders, Kristoffer
%A Bai, Peixuan
%A Wang, Yongmin
%A Kempen, Tim
%A Sarantopoulos, Alexandros
%A Wouters, Dirk
%A Rana, Vikas
%A Dittmann, Regina
%A Waser, R.
%A Menzel, Stephan
%A Wiefels, Stefan
%T Exploiting read noise of filamentary VCM ReRAM for robust TRNG
%J IEEE transactions on electron devices
%V 1
%@ 0018-9383
%C New York, NY
%I IEEE
%M FZJ-2025-03781
%P 1
%D 2025
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1109/TED.2025.3611916
%U https://juser.fz-juelich.de/record/1046352