In-operando atomic force microscopy and high-resolution electron microscopy on functional layers in batteries &amp; electrolyzers

Hausen, Florian; Schierholz, Roland

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Home > Publications database > In-operando atomic force microscopy and high-resolution electron microscopy on functional layers in batteries & electrolyzers > RIS

TY  - CONF
AU  - Hausen, Florian
AU  - Schierholz, Roland
TI  - In-operando atomic force microscopy and high-resolution electron microscopy on functional layers in batteries &amp; electrolyzers
M1  - FZJ-2026-00583
PY  - 2025
T2  - CSE Seminar - Argonne National Laboratory
CY  - ,  (USA)
M2  - , USA
LB  - PUB:(DE-HGF)31
UR  - https://juser.fz-juelich.de/record/1051675
ER  -

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