Journal Article FZJ-2026-02181

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Evaluation of Cryogenic Model Libraries for FDSOI CMOS Transistors

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2026
IEEE New York, NY

IEEE transactions on electron devices TBD, 1 - 8 () [10.1109/TED.2026.3675187]

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Abstract: Scalable quantum computers demand innovative solutions to tackle the wiring bottleneck and control an increasing number of qubits. Cryogenic electronics based on CMOS technologies are promising candidates that can operate down to deep-cryogenic temperatures and act as a communication and control interface to the quantum layer. However, the performance of transistors used in these circuits is altered significantly when cooling from room temperature to cryogenic temperatures, which motivates accurate cryogenic modeling of transistors. In this article, we report on a cryogenic simulation library tailored specifically to fully depleted silicon-on-insulator (FDSOI) transistors. We validated the accuracy of our preliminary model library by comparing simulations at both the device and circuit levels with experimental measurements from single transistors, ring oscillators, and a transimpedance amplifier (TIA). Our models effectively capture the DC behavior across the temperature range from 8 K to room temperature.

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Note: Bitte Post-print ergänzen

Contributing Institute(s):
  1. Integrated Computing Architectures (PGI-4)
Research Program(s):
  1. 5223 - Quantum-Computer Control Systems and Cryoelectronics (POF4-522) (POF4-522)

Appears in the scientific report 2026
Database coverage:
Medline ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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 Record created 2026-04-08, last modified 2026-04-14


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