Journal Article

FZJ-2026-03525

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Model for Imaging in High-Resolution Secondary Electron Microscopy

Barthel, J. (Corresponding author)FZJ* ; Liu, X. ; Brown, H. G. ; Allen, L. J.

2026
Oxford University Press Oxford

This record in other databases:  

Please use a persistent id in citations: doi:10.1093/mam/ozag038

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)

Research Program(s):

1. 5353 - Understanding the Structural and Functional Behavior of Solid State Systems (POF4-535) (POF4-535)

Appears in the scientific report 2026

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Database coverage:
; BIOSIS Previews ; Biological Abstracts ; Clarivate Analytics Master Journal List ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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