TY  - JOUR
AU  - Habicht, S.
AU  - Feste, S.
AU  - Zhao, Q.T.
AU  - Buca, D.
AU  - Mantl, S.
TI  - Electrical characterization of O-gated uniaxial tensile strained Si nanowire-array metal-oxide-semiconductor field effect transistors with <100> and <110> channel orientations
JO  - Thin solid films
VL  - 520
SN  - 0040-6090
CY  - Amsterdam [u.a.]
PB  - Elsevier
M1  - PreJuSER-111888
SP  - 3332 - 3336
PY  - 2012
N1  - Record converted from VDB: 16.11.2012
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000301710800044
DO  - DOI:10.1016/j.tsf.2011.08.034
UR  - https://juser.fz-juelich.de/record/111888
ER  -