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High mobility strained SOI MOSFETs with LaScO3/TiN gate stacks fabricated with a replacement gate process
Durgun Özben, E.FZJ* ; Lopes, J. M. J.FZJ* ; Roeckerath, M.FZJ* ; Nichau, A.FZJ* ; Luptak, R.FZJ* ; Lenk, S.FZJ* ; Besmehn, A. ; Ghyselen, B. ; Zhao, Q. T.FZJ* ; Schubert, J.FZJ* ; Mantl, S.FZJ*
2010
2010Proceedings of ULIS (Ultimate Integration on Silicon) 17-19 March 2010, Glasgow, Scotland. - S. 93 - 96
Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
- Halbleiter-Nanoelektronik (IBN-1)
- Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)
Research Program(s):
- Grundlagen für zukünftige Informationstechnologien (P42)
Appears in the scientific report
2010
Notes: Proceedings