Hauptseite > Publikationsdatenbank > Formation and characterization of Ultra-Thin NiSi, Ni1-xPtxSi and epitaxial NiSi2on Si(001) substrates > EndNote Text |
%0 Conference Paper %A Knoll, L. %A Zhao, Q. T. %A Urban, C. %A Habicht, S. %A Fox, A. %A Mantl, S. %T Formation and characterization of Ultra-Thin NiSi, Ni1-xPtxSi and epitaxial NiSi2on Si(001) substrates %M PreJuSER-11479 %D 2010 %Z Record converted from VDB: 12.11.2012 %< Materials for Advanced Metallization (MAM) Conference Y2 7 Mar 2010 M2 Mechelen, Belgium, %F PUB:(DE-HGF)6 %9 Conference Presentation %U https://juser.fz-juelich.de/record/11479