001     12075
005     20180208212934.0
024 7 _ |2 pmid
|a pmid:20634573
024 7 _ |2 DOI
|a 10.1088/0957-4484/21/31/315301
024 7 _ |2 WOS
|a WOS:000279961200010
037 _ _ |a PreJuSER-12075
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Nanoscience & Nanotechnology
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Skorb, E.V.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Titania-assisted electron-beam and synchrotron lithography
260 _ _ |a Bristol
|b IOP Publ.
|c 2010
300 _ _ |a 315301
336 7 _ |a Journal Article
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
|2 DRIVER
440 _ 0 |a Nanotechnology
|x 0957-4484
|0 4475
|y 31
|v 21
500 _ _ |a This work was supported by the Humboldt Foundation and the NATO Collaboration Linkage grant. EV thanks Dr Dmitry Shchukin for helpful discussion.
520 _ _ |a Novel imaging layer technology for electron-beam and extreme-ultraviolet lithographic processes based upon generation of Pd nanoparticles in the Pd(2+)-loaded TiO(2) films was developed. The electroless metallization of the patterned TiO(2):Pd(2+) films yields both negative and positive nickel images with resolution down to approximately 100 nm.
536 _ _ |a Grundlagen für zukünftige Informationstechnologien
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588 _ _ |a Dataset connected to Web of Science, Pubmed
650 _ 7 |a J
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700 1 _ |a Grützmacher, D.
|b 1
|u FZJ
|0 P:(DE-Juel1)125588
700 1 _ |a Dais, C.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Guzenko, V.A.
|b 3
|0 P:(DE-HGF)0
700 1 _ |a Sokolov, V.G.
|b 4
|0 P:(DE-HGF)0
700 1 _ |a Gaevskaya, T.V.
|b 5
|0 P:(DE-HGF)0
700 1 _ |a Sviridov, D.V.
|b 6
|0 P:(DE-HGF)0
773 _ _ |a 10.1088/0957-4484/21/31/315301
|g Vol. 21, p. 315301
|p 315301
|q 21<315301
|0 PERI:(DE-600)1362365-5
|t Nanotechnology
|v 21
|y 2010
|x 0957-4484
856 7 _ |u http://dx.doi.org/10.1088/0957-4484/21/31/315301
909 C O |o oai:juser.fz-juelich.de:12075
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914 1 _ |y 2010
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |d 31.12.2010
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|l Halbleiter-Nanoelektronik
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920 1 _ |0 I:(DE-82)080009_20140620
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Marc 21