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Advanced electrical impedance tomography system with high phase accuracy
Zimmermann, E.ZEA-2*FZJ* ; Huisman, J. A.FZJ* ; Kemna, A. ; Berwix, J.ZEA-2*FZJ* ; Glaas, W.ZEA-2*FZJ* ; Meier, H.ZEA-2*FZJ* ; Wolters, B.ZEA-2*FZJ* ; Esser, O.FZJ*
2010
20106th World Congress on Industrial Process Tomography, BejingBejing, China, 6 Sep 2010 - 9 Sep 20102010-09-062010-09-09
583-591 (2010)2010
Contributing Institute(s):
- Zentralinstitut für Elektronik (ZEL)
- Agrosphäre (IBG-3)
Research Program(s):
- 246 - Modelling and Monitoring Terrestrial Systems: Methods and Technologies (POF2-246) (POF2-246)
Appears in the scientific report
2012