000132040 001__ 132040
000132040 005__ 20210129211334.0
000132040 0247_ $$2doi$$a10.1063/1.4789972
000132040 0247_ $$2ISSN$$a1077-3118
000132040 0247_ $$2ISSN$$a0003-6951
000132040 0247_ $$2WOS$$aWOS:000315053300045
000132040 0247_ $$2Handle$$a2128/5013
000132040 037__ $$aFZJ-2013-01283
000132040 082__ $$a530
000132040 1001_ $$0P:(DE-HGF)0$$aMelville, A.$$b0$$eCorresponding author
000132040 245__ $$aEffect of film thickness and biaxial strain on the curie temperature of EuO
000132040 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2013
000132040 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s132040
000132040 3367_ $$2DataCite$$aOutput Types/Journal article
000132040 3367_ $$00$$2EndNote$$aJournal Article
000132040 3367_ $$2BibTeX$$aARTICLE
000132040 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000132040 3367_ $$2DRIVER$$aarticle
000132040 500__ $$3POF3_Assignment on 2016-02-29
000132040 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000132040 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000132040 7001_ $$0P:(DE-HGF)0$$aMairoser, T.$$b1
000132040 7001_ $$0P:(DE-HGF)0$$aSchmehl, A.$$b2
000132040 7001_ $$0P:(DE-HGF)0$$aBirol, T.$$b3
000132040 7001_ $$0P:(DE-HGF)0$$aHeeg, T.$$b4
000132040 7001_ $$0P:(DE-Juel1)125595$$aHolländer, Bernhard$$b5
000132040 7001_ $$0P:(DE-Juel1)128631$$aSchubert, Jürgen$$b6
000132040 7001_ $$0P:(DE-HGF)0$$aFennie, C. J.$$b7
000132040 7001_ $$0P:(DE-HGF)0$$aSchlom, D. G.$$b8
000132040 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.4789972$$gVol. 102, no. 6, p. 062404 -$$n6$$p062404 -$$tApplied physics letters$$v102$$x0003-6951$$y2013
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-2013-01283.pdf$$yOpenAccess
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-132040.pdf$$yPublished under German "Allianz" Licensing conditions on 2013-02-11. Available in OpenAccess from 2013-02-11$$zPublished final document.
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-132040.jpg?subformat=icon-1440$$xicon-1440
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-132040.jpg?subformat=icon-180$$xicon-180
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-132040.jpg?subformat=icon-640$$xicon-640
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-2013-01283.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-2013-01283.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000132040 8564_ $$uhttps://juser.fz-juelich.de/record/132040/files/FZJ-2013-01283.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000132040 909CO $$ooai:juser.fz-juelich.de:132040$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000132040 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)125595$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000132040 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)128631$$aForschungszentrum Jülich GmbH$$b6$$kFZJ
000132040 9132_ $$0G:(DE-HGF)POF3-529H$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vAddenda$$x0
000132040 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000132040 9141_ $$y2013
000132040 915__ $$0StatID:(DE-HGF)0010$$2StatID$$aJCR/ISI refereed
000132040 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000132040 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000132040 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000132040 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000132040 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000132040 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000132040 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000132040 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG
000132040 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000132040 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000132040 915__ $$0StatID:(DE-HGF)0520$$2StatID$$aAllianz-OA
000132040 915__ $$0StatID:(DE-HGF)1020$$2StatID$$aDBCoverage$$bCurrent Contents - Social and Behavioral Sciences
000132040 920__ $$lyes
000132040 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
000132040 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJülich-Aachen Research Alliance - Fundamentals of Future Information Technology$$x1
000132040 9801_ $$aFullTexts
000132040 980__ $$ajournal
000132040 980__ $$aUNRESTRICTED
000132040 980__ $$aJUWEL
000132040 980__ $$aFullTexts
000132040 980__ $$aI:(DE-Juel1)PGI-9-20110106
000132040 980__ $$aI:(DE-82)080009_20140620
000132040 980__ $$aVDB
000132040 981__ $$aI:(DE-Juel1)VDB881