Journal Article

FZJ-2013-01283

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Effect of film thickness and biaxial strain on the curie temperature of EuO

Melville, A. (Corresponding author) ; Mairoser, T. ; Schmehl, A. ; Birol, T. ; Heeg, T. ; Holländer, B.FZJ* ; Schubert, J.FZJ* ; Fennie, C. J. ; Schlom, D. G.

2013
American Institute of Physics Melville, NY

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/5013  doi:10.1063/1.4789972

---

Contributing Institute(s):

1. Halbleiter-Nanoelektronik (PGI-9)
2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. 421 - Frontiers of charge based Electronics (POF2-421) (POF2-421)

Appears in the scientific report 2013

---

Database coverage:
; ; ; Allianz-Lizenz / DFG ; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---