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@ARTICLE{Melville:132040,
      author       = {Melville, A. and Mairoser, T. and Schmehl, A. and Birol, T.
                      and Heeg, T. and Holländer, Bernhard and Schubert, Jürgen
                      and Fennie, C. J. and Schlom, D. G.},
      title        = {{E}ffect of film thickness and biaxial strain on the curie
                      temperature of {E}u{O}},
      journal      = {Applied physics letters},
      volume       = {102},
      number       = {6},
      issn         = {0003-6951},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {FZJ-2013-01283},
      pages        = {062404 -},
      year         = {2013},
      cin          = {PGI-9 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-9-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {421 - Frontiers of charge based Electronics (POF2-421)},
      pid          = {G:(DE-HGF)POF2-421},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000315053300045},
      doi          = {10.1063/1.4789972},
      url          = {https://juser.fz-juelich.de/record/132040},
}