TY  - JOUR
AU  - Nichau, Alexander
AU  - Rubio-Zuazo, J.
AU  - Schnee, Michael
AU  - Castro, G. R.
AU  - Schubert, Jürgen
AU  - Mantl, Siegfried
TI  - Effective attenuation length for lanthanum lutetium oxide between 7 and 13 keV
JO  - Applied physics letters
VL  - 102
IS  - 3
SN  - 0003-6951
CY  - Melville, NY
PB  - American Institute of Physics
M1  - FZJ-2013-01284
SP  - 031607 
PY  - 2013
AB  - To obtain quantitative depth information from hard X-ray photoemission spectroscopy, the effective attenuation length (EAL) is required. In this paper, the EAL was determined for LaLuO3 for electron kinetic energies between 7 and 13 keV. As a result, the EAL is in the range of 100–150A ° for the investigated photon energies. In addition, higher binding energy orbitals of La and Lu were measured and are discussed. LaLuO3 is a promising high-k dielectric for future nano-scaled MOS devices.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000314032600028
DO  - DOI:10.1063/1.4789524
UR  - https://juser.fz-juelich.de/record/132041
ER  -