Journal Article

FZJ-2013-01802

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png In-situ Raman spectroscopy used to study and control the initial growth phase of microcrystalline absorber layers for thin-film silicon solar cells

Muthmann, S. (Corresponding author)FZJ* ; Köhler, F.FZJ* ; Meier, M.FZJ* ; Hülsbeck, M.FZJ* ; Carius, R.FZJ* ; Gordijn, A.FZJ*

2012
Elsevier Science Amsterdam [u.a.]

This record in other databases:  

Please use a persistent id in citations: doi:10.1016/j.jnoncrysol.2011.12.061

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Contributing Institute(s):

1. Photovoltaik (IEK-5)

Research Program(s):

1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

Appears in the scientific report 2012

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Database coverage:
; Current Contents - Social and Behavioral Sciences ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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