%0 Journal Article
%A Muthmann, Stefan
%A Köhler, Florian
%A Meier, Matthias
%A Hülsbeck, Markus
%A Carius, Reinhard
%A Gordijn, Aad
%T In-situ Raman spectroscopy used to study and control the initial growth phase of microcrystalline absorber layers for thin-film silicon solar cells
%J Journal of non-crystalline solids
%V 358
%N 17
%@ 0022-3093
%C Amsterdam [u.a.]
%I Elsevier Science
%M FZJ-2013-01802
%P 1970 - 1973
%D 2012
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000310394700009
%R 10.1016/j.jnoncrysol.2011.12.061
%U https://juser.fz-juelich.de/record/133265