Hauptseite > Publikationsdatenbank > In-situ Raman spectroscopy used to study and control the initial growth phase of microcrystalline absorber layers for thin-film silicon solar cells > print

001     133265
005     20240708133650.0
024 7 _ |a 10.1016/j.jnoncrysol.2011.12.061
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024 7 _ |a 1873-4812
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024 7 _ |a 0022-3093
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024 7 _ |a WOS:000310394700009
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037 _ _ |a FZJ-2013-01802
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100 1 _ |a Muthmann, Stefan
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245 _ _ |a In-situ Raman spectroscopy used to study and control the initial growth phase of microcrystalline absorber layers for thin-film silicon solar cells
260 _ _ |a Amsterdam [u.a.]
|c 2012
|b Elsevier Science
336 7 _ |a Journal Article
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536 _ _ |a 111 - Thin Film Photovoltaics (POF2-111)
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700 1 _ |a Köhler, Florian
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700 1 _ |a Meier, Matthias
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700 1 _ |a Hülsbeck, Markus
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700 1 _ |a Carius, Reinhard
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700 1 _ |a Gordijn, Aad
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773 _ _ |a 10.1016/j.jnoncrysol.2011.12.061
|g Vol. 358, no. 17, p. 1970 - 1973
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|t Journal of non-crystalline solids
|v 358
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914 1 _ |y 2012
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