Journal Article

FZJ-2013-01826

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png The relationship between hydrogen and paramagnetic defects in thin film silicon irradiated with 2 MeV electrons

Astakhov, O. (Corresponding author)FZJ* ; Carius, R.FZJ* ; Petrusenko, Y. ; Borysenko, V. ; Barankov, D. ; Finger, F.

2012
IOP Publ. Bristol

This record in other databases:    

Please use a persistent id in citations: doi:10.1088/0953-8984/24/30/305801

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Contributing Institute(s):

1. Photovoltaik (IEK-5)

Research Program(s):

1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

Appears in the scientific report 2012

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Database coverage:
; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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