Journal Article

FZJ-2013-03374

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Annealing of nm-thin Si1-xCx/SiC multilayers

Künle, M. (Corresponding author) ; Janz, S. ; Nickel, K. G. ; Heidt, A.FZJ* ; Luysberg, M.FZJ* ; Eibl, O.

2013
North Holland Amsterdam

This record in other databases:  

Please use a persistent id in citations: doi:10.1016/j.solmat.2013.03.011

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 421 - Frontiers of charge based Electronics (POF2-421) (POF2-421)

Appears in the scientific report 2013

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Database coverage:
Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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