%0 Journal Article
%A Irmer, G.
%A Monecke, J.
%A Verma, P.
%A Goerigk, G.
%A Herms, M.
%T Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering
%J Journal of applied physics
%V 88
%N 4
%@ 0021-8979
%C Melville, NY
%I American Institute of Physics
%M FZJ-2013-04435
%P 1873 - 1879
%D 2000
%Z Retrokatalogisat aus JUWEL, u.U. falsche Institutszuordnung.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000088783800028
%R 10.1063/1.1305462
%U https://juser.fz-juelich.de/record/138278