Journal Article

FZJ-2013-04435

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering

Irmer, G. (Corresponding author) ; Monecke, J. ; Verma, P. ; Goerigk, G.FZJ* ; Herms, M.

2000
American Institute of Physics Melville, NY

This record in other databases:    

Please use a persistent id in citations: http://hdl.handle.net/2128/805  doi:10.1063/1.1305462

Note: Retrokatalogisat aus JUWEL, u.U. falsche Institutszuordnung.

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Contributing Institute(s):

1. Streumethoden (IFF-4)
2. Institut für Festkörperforschung (IFF)

Research Program(s):

1. 899 - ohne Topic (POF2-899) (POF2-899)
2. Methodenentwicklung für Synchrotron- und Neutronenstrahlung (FUEK58) (FUEK58)

Appears in the scientific report 2000
Notes: This version is available at the following URL: http://jap.aip.org/

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Database coverage:
; ; Allianz-Lizenz / DFG ; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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