TY  - JOUR
AU  - Irmer, G.
AU  - Monecke, J.
AU  - Verma, P.
AU  - Goerigk, G.
AU  - Herms, M.
TI  - Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering
JO  - Journal of applied physics
VL  - 88
IS  - 4
SN  - 0021-8979
CY  - Melville, NY
PB  - American Institute of Physics
M1  - FZJ-2013-04435
SP  - 1873 - 1879
PY  - 2000
N1  - Retrokatalogisat aus JUWEL, u.U. falsche Institutszuordnung.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000088783800028
DO  - DOI:10.1063/1.1305462
UR  - https://juser.fz-juelich.de/record/138278
ER  -