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@ARTICLE{Irmer:138278,
      author       = {Irmer, G. and Monecke, J. and Verma, P. and Goerigk, G. and
                      Herms, M.},
      title        = {{S}ize analysis of nanocrystals in semiconductor doped
                      silicate glasses with anomalous small-angle x ray and
                      {R}aman scattering},
      journal      = {Journal of applied physics},
      volume       = {88},
      number       = {4},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {FZJ-2013-04435},
      pages        = {1873 - 1879},
      year         = {2000},
      note         = {Retrokatalogisat aus JUWEL, u.U. falsche
                      Institutszuordnung.},
      cin          = {IFF-4 / IFF},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB784 / I:(DE-Juel1)VDB241},
      pnm          = {899 - ohne Topic (POF2-899) / Methodenentwicklung für
                      Synchrotron- und Neutronenstrahlung (FUEK58)},
      pid          = {G:(DE-HGF)POF2-899 / G:(DE-Juel1)FUEK58},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000088783800028},
      doi          = {10.1063/1.1305462},
      url          = {https://juser.fz-juelich.de/record/138278},
}