%0 Journal Article
%A Korte, Stefan
%A Steidl, Matthias
%A Prost, Werner
%A Cherepanov, Vasily
%A Voigtländer, Bert
%A Zhao, Weihong
%A Kleinschmidt, Peter
%A Hannappel, Thomas
%T Resistance and dopant profiling along freestanding GaAs nanowires
%J Applied physics letters
%V 103
%N 14
%@ 0003-6951
%C Melville, NY
%I American Institute of Physics
%M FZJ-2013-04587
%P 143104 -
%D 2013
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000325488500088
%R 10.1063/1.4823547
%U https://juser.fz-juelich.de/record/138476