Journal Article

FZJ-2013-04587

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Resistance and dopant profiling along freestanding GaAs nanowires

Korte, S. (Corresponding author)FZJ* ; Steidl, M. ; Prost, W. ; Cherepanov, V.FZJ* ; Voigtländer, B.FZJ* ; Zhao, W. ; Kleinschmidt, P. ; Hannappel, T.

2013
American Institute of Physics Melville, NY

This record in other databases:    

Please use a persistent id in citations: http://hdl.handle.net/2128/17348  doi:10.1063/1.4823547

---

Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)

Research Program(s):

1. 424 - Exploratory materials and phenomena (POF2-424) (POF2-424)

Appears in the scientific report 2013

---

Database coverage:
; ; Allianz-Lizenz / DFG ; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---