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000138476 1001_ $$0P:(DE-Juel1)138943$$aKorte, Stefan$$b0$$eCorresponding author$$ufzj
000138476 245__ $$aResistance and dopant profiling along freestanding GaAs nanowires
000138476 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2013
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000138476 7001_ $$0P:(DE-HGF)0$$aSteidl, Matthias$$b1
000138476 7001_ $$0P:(DE-HGF)0$$aProst, Werner$$b2
000138476 7001_ $$0P:(DE-Juel1)128762$$aCherepanov, Vasily$$b3$$ufzj
000138476 7001_ $$0P:(DE-Juel1)128794$$aVoigtländer, Bert$$b4$$ufzj
000138476 7001_ $$0P:(DE-HGF)0$$aZhao, Weihong$$b5
000138476 7001_ $$0P:(DE-HGF)0$$aKleinschmidt, Peter$$b6
000138476 7001_ $$0P:(DE-HGF)0$$aHannappel, Thomas$$b7
000138476 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.4823547$$gVol. 103, no. 14, p. 143104 -$$n14$$p143104 -$$tApplied physics letters$$v103$$x0003-6951$$y2013
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