Journal Article

FZJ-2013-04809

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Low-temperature conductance of the weak junction in InAs nanowire in the field of AFM scanning gate

Zhukov, A. A. (Corresponding author) ; Volk, C.FZJ* ; Winden, A.FZJ* ; Hardtdegen, H.FZJ* ; Schäpers, T.FZJ*

2011
Springer Heidelberg [u.a.]

This record in other databases:  

Please use a persistent id in citations: doi:10.1134/S0021364011010103

Abstract: We have investigated the conductance of an InAs nanowire in the presence of an electrical potential created by an AFM scanning gate at liquid helium temperature. The influence of the direction of a local electrical field on the tunneling rate through a weak junction in the InAs wire is clearly observed. To explain this behavior, the redistribution of the electrons among conductive channels in the wire must be taken into account. We have confirmed that the pattern of Coulomb blockade diamonds gives the same result for the ratio of quantum dot sizes as that revealed by scanning gate imaging.

---

Contributing Institute(s):

1. Halbleiter-Nanoelektronik (PGI-9)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 422 - Spin-based and quantum information (POF2-422) (POF2-422)

Appears in the scientific report 2013

---

Database coverage:
JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection ; Zoological Record

---