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000139411 1001_ $$0P:(DE-Juel1)130237$$aErmes, Markus$$b0$$eCorresponding author$$ufzj
000139411 1112_ $$aSPIE Optical Metrology 2013$$cMunich, , Germany$$d2013-05-13 - 2013-05-16$$wGermany
000139411 245__ $$aReconstruction of SNOM near-field images from rigorous optical simulations by including topography artifacts
000139411 260__ $$c2013
000139411 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1385019389_32295$$xOther
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000139411 536__ $$0G:(DE-HGF)POF2-111$$a111 - Thin Film Photovoltaics (POF2-111)$$cPOF2-111$$fPOF II$$x0
000139411 7001_ $$0P:(DE-Juel1)130264$$aLehnen, Stephan$$b1$$ufzj
000139411 7001_ $$0P:(DE-Juel1)130219$$aBittkau, Karsten$$b2$$ufzj
000139411 7001_ $$0P:(DE-Juel1)130225$$aCarius, Reinhard$$b3$$ufzj
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000139411 9141_ $$y2013
000139411 920__ $$lyes
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