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@INPROCEEDINGS{Ermes:139411,
      author       = {Ermes, Markus and Lehnen, Stephan and Bittkau, Karsten and
                      Carius, Reinhard},
      title        = {{R}econstruction of {SNOM} near-field images from rigorous
                      optical simulations by including topography artifacts},
      reportid     = {FZJ-2013-05407},
      year         = {2013},
      month         = {May},
      date          = {2013-05-13},
      organization  = {SPIE Optical Metrology 2013, Munich, ,
                       Germany (Germany), 13 May 2013 - 16 May
                       2013},
      subtyp        = {Other},
      cin          = {IEK-5},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {111 - Thin Film Photovoltaics (POF2-111)},
      pid          = {G:(DE-HGF)POF2-111},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/139411},
}