%0 Conference Paper
%A Ebert, Philipp
%T Cross-sectional scanning tunneling microscopy of nitride semiconductors
%M FZJ-2013-05572
%D 2013
%B Microscopy of Semiconductor Materials 18
%C 7 Apr 2013 - 11 Apr 2013, Oxford (UK)
Y2 7 Apr 2013 - 11 Apr 2013
M2 Oxford, UK
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/139590