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Conference Presentation (Invited) FZJ-2013-05572
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Cross-sectional scanning tunneling microscopy of nitride semiconductors



2013

Microscopy of Semiconductor Materials 18, OxfordOxford, UK, 7 Apr 2013 - 11 Apr 20132013-04-072013-04-11

Contributing Institute(s):
  1. Mikrostrukturforschung (PGI-5)
Research Program(s):
  1. 421 - Frontiers of charge based Electronics (POF2-421) (POF2-421)

Appears in the scientific report 2013
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Document types > Presentations > Conference Presentations
Institute Collections > ER-C > ER-C-1
Institute Collections > PGI > PGI-5
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 Record created 2013-11-20, last modified 2024-06-10
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