000139590 001__ 139590
000139590 005__ 20240610115955.0
000139590 037__ $$aFZJ-2013-05572
000139590 041__ $$aEnglish
000139590 1001_ $$0P:(DE-Juel1)130627$$aEbert, Philipp$$b0$$eCorresponding author$$ufzj
000139590 1112_ $$aMicroscopy of Semiconductor Materials 18$$cOxford$$d2013-04-07 - 2013-04-11$$wUK
000139590 245__ $$aCross-sectional scanning tunneling microscopy of nitride semiconductors
000139590 260__ $$c2013
000139590 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1384955018_32291$$xInvited
000139590 3367_ $$033$$2EndNote$$aConference Paper
000139590 3367_ $$2DataCite$$aOther
000139590 3367_ $$2ORCID$$aLECTURE_SPEECH
000139590 3367_ $$2DRIVER$$aconferenceObject
000139590 3367_ $$2BibTeX$$aINPROCEEDINGS
000139590 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000139590 909CO $$ooai:juser.fz-juelich.de:139590$$pVDB
000139590 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130627$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000139590 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000139590 9141_ $$y2013
000139590 920__ $$lyes
000139590 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000139590 980__ $$aconf
000139590 980__ $$aVDB
000139590 980__ $$aUNRESTRICTED
000139590 980__ $$aI:(DE-Juel1)PGI-5-20110106
000139590 981__ $$aI:(DE-Juel1)ER-C-1-20170209